Miller D.J., Rupich M., Welp U., Fleshler S., Civale L., Ghigo G., Laviano F., Kwok W.K., Kayani A., Leroux M., Eley S., Kihlstrom K.J., Niraula P.
Miller D.J., Rupich M.W., Welp U., Civale L., Kwok W., Kayani A., Leroux M., Eley S., Niraula P.M., Sheng H.
Miller D.J., Rupich M.W., Welp U., Fleshler S., Sathyamurthy S., Civale L., Li Q., Solovyov V., Kwok W., Ozaki T., Kayani A., Koshelev A.E., Leroux M., Eley S., Kihlstrom K.
Miller D.J., Rupich M.W., Welp U., Fleshler S., Sathyamurthy S., Civale L., Kayani A., Leroux M., Eley S., Niraula P.M., Kwok W.-K., Kihlstrom K.J., Holleis S., Sheng H.P.
Miller D.J., Rupich M.W., Li X., Malozemoff A.P., Welp U., Fleshler S., Sathyamurthy S., Civale L., Kwok W.K., Jia Y., Kayani A., Leroux M., Wen J.G., Ayala-Valenzuela O.
Miller D.J., Zhang Y., Selvamanickam V., Chen Y., Majkic G., Guevara A., Shi T., Yao Y., Lei C., Galtsyan E.
Ключевые слова: HTS, YBCO, doping effect, REBCO, coated conductors, composition, microstructure, pinning, critical caracteristics, angular dependence, critical current, experimental results
Miller D.J., Maroni V.A., Specht E.D., Chen Z., Aytug T., Paranthaman M.P., Zuev Y., Kropf A.J., Zaluzec N.J.
Miller D.J., Maroni V.A., Specht E.D., Paranthaman M., Aytug T., Cantoni C., Zhang Y., Zuev Y., Kropf A.J., Chen Z.*21, Zaluzec N.
Ключевые слова: presentation, HTS, YBCO, coated conductors, MOD process, MOCVD process, comparison, microstructure, doping effect, fabrication, defects, nanoscaled effects, critical caracteristics, critical current density, angular dependence, phase composition, Raman spectroscopy, defects columnar, critical current
Ключевые слова: HTS, YBCO, REBCO, coated conductors, RABITS process, TFA-MOD process, fabrication, Raman spectroscopy, phase formation, thickness dependence, time evolution
Ключевые слова: presentation, collaborations, funding, critical caracteristics, critical current, homogeneity, long conductors, thickness dependence, HTS, MOD process, YBCO, nucleation, growth rate, fabrication, interfaces, magnetic field dependence, films thick, resistivity, temperature dependence, Jc/B curves, pinning force, RABITS process, experimental results, coated conductors
Ключевые слова: patents, fabrication, ISD process, HTS, YBCO, coated conductors, buffer layers, deposition setup, substrate metallic
Ключевые слова: HTS, coated conductors, MOD process, YBCO, nucleation, fabrication, thickness dependence, critical caracteristics, RABITS process, plans, funding, presentation
Ключевые слова: HTS, YBCO, coated conductors, MOCVD process, long conductors, critical caracteristics, fabrication, doping effect, plans, funding, presentation
Miller D.J., Maroni V.A., Rupich M.W., Li X., Specht E.D., Christen D.K., Larbalestier D.C., Sathyamurthy S., Thompson J.R., Feenstra R., Xu A., Sinclair J.
Miller D.J., Maroni V.A., Li X., Rupich M., Chen Z., Sathyamurthy S., Feenstra R., Zaluzec N.J., Cooley K.
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